Build Better Chips, See Better Yield: The Resource Bundle for Vision AI in Wafer Inspection
What's in the Resource Bundle?
Whitepaper
AI defect classification is no longer optional—but how you adopt it matters. Should your fab build inspection software in-house, or invest in a proven vendor-supported platform? This whitepaper breaks down the trade-offs in plain business terms and offers a roadmap to achieve ROI without delays.
Checklist
Scaling AI-powered inspection doesn’t have to be risky. This practical checklist walks you through the six proven steps fabs use to move from pilot projects to full production—covering dataset curation, shadow mode, validation, and fab-wide deployment.
Infographic
Traditional inspection workflows are drowning in noise from ADR systems and manual review. This infographic shows four ways Robovision transforms inspection, from intelligent data capture and automated labeling to continuous monitoring and yield improvements.
Why Fabs Are Turning to Vision AI
And how you can apply the same approach with our resource bundle.
10-15%
faster yield ramp+30%
cost savings-50%
downtimeEnough about the AI hype.
Download the resource bundle to see what actually works and how you can benefit from it.
